AFM, Bruker Dimension Icon

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Atomic Force Microscope (AFM): Bruker Dimension Icon


AFM provides:

  • Standard technique for surface analysis of materials
  • Resolution greater than 1000 times than optical diffraction limit
  • High-resolution imaging of surface features at angstrom scales
  • Piezoelectric ceramics for accurate scan head control
  • Analysis in fluid cells and in controlled environments
  • Atomic-scale surface manipulation and modification
  • Quantitative measurement of surface roughness
  • Elastic modulus  ranges from ~1 MPa to 50 Gpa
  • Adhesion forces ranges from ~10 pN to 10 N

Available Modes:


  • ·         Contact mode
  • ·         Tapping mode
  • ·         Veeco ScanAsyst and PeakForce™ Tapping Mode
  • ·         Magnetic Force Microscopy
  • ·         Fluid Cell Imaging
  • ·         Special deep trench probe for high aspect ratio imaging.
  • ·         The AFM supports other modes of operations. Contact staff for available modes. User must provide own specialized tips.


Future Upgrades (contact staff for more information):

  • Expansion of capabilities for Kelvin Probe Force Microscopy
  • Scanning Capacitance Microscopy (SCM) and Scanning Spreading Resistance Microscopy (SSRM) for resistivity measurements with upgrade.

 Sample Requirements:

  • The sample platen can take up to 200mm diameter samples.
  • The maximum Z scanning height is of the order of 5µm.
  • The maximum height of a sample is of the order of 12mm.
  • Maximum height of a sample is approximately 12mm.




Training available by request. Please contact Dr. Brian Van Devener if you are interested in signing up for a training session.


Contact Information


Dr. Brian Van Devener

Phone: (801) 587-3108








Last Updated: July 27,2011


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